Equipment
Scanning Electron Microscope
Aphid feeding on a moss of the genus Polytrichum. (photo: R.Thomas)
The JEOL JSM-6100 scanning electron microscope (SEM) was acquired in 1990. This instrument was one of the first SEMs equipped with digital imaging capabilities and includes secondary and backscatter detectors. It is equipped with a standard tungsten filament gun and offers resolution of approximately 5-10 nm at 30 kV. All imaging is now done digitally via the EDS system using AIA2 digital imaging software and can be exported via the network. For teaching and demonstrations we can project real time digital images from the SEM in our main lecture halls through the video projection system in conjunction with two way voice communication.
UPDATE: In AY ’12/’13 we will replace the SEM with a state-of-the -art tungsten gun model to be funded by a grant to Bates College from the Sherman-Fairchild Foundation.
Energy Dispersive Spectrometer
The SEM is equipped with a Noran/KEVEX SuperDry (ln-free) Quantum Energy Dispersive Spectrometer and Sigma Level 3 X-ray microanalysis software. The SuperDry detector is LN-free and is equipped with a beryllium window allowing limited detection of light elements. This system enables quantitative spectrum analysis with and without standards, x-ray mapping, principal components analysis, and digital image acquisition.
UPDATE: In AY ’12/’13 we will replace the EDS with a state-of-the -art, full spectrum sampling capable system to be funded by a grant to Bates College from the Sherman-Fairchild Foundation.
Support Equipment and Services
- Denton Vacuum DV1 Carbon Coater; attachments for rods or yarn (1997)
- Anatech Hummer VI Sputter Coater with rotating stage and Au/Pd target (2010)
- Ladd Research CO2 Critical Point Dryer (1990)
- VCR and monitor linked to SEM for real-time videotaping
- Image analysis software (AIA2)
- HP 800PS Large Format Printer
- Fume hood
- Complete machine shop and machinist