Field Emission Variable Vacuum Scanning Electron Microscope with EDS
JEOL JSM-7100FLV field emission, variable vacuum, analytical scanning electron microscope (FE-SEM/EDS) (2012).
This instrument is equipped with a sample chamber-level secondary electron detector and both HV and LV backscatter detectors. It is equipped with a Schottkey thermal field emission gun and offers resolution of approximately 2-3 nm at 30 kV.
Energy Dispersive Spectrometer
The SEM is equipped with a Thermo/ Noran System 7 Energy Dispersive Spectrometer with a LN-free digital detector. This system enables quantitative spectrum analysis with and without standards, spectral imaging, x-ray mapping, x-ray line scans, point and shoot sampling, and digital image acquisition.
The Leica confocal microscope came on line in Fall 2014 and is used extensively by biology, physics, and neursoscience faculty and students.
Other light microscopes available
- Nikon SMZ1500 steromicroscope (located in Carnegie 431)
- Modular Focus microscope
- Nikon TE2000-E Inverted Fluorescence Motorized Phase Contrast Microscope
- Nikon 80i Fluorescence Upright Microscope
Other Support Equipment and Services
- Denton Vacuum DV1 Carbon Evaporation unit; attachments for rods or yarn (1997)
- Anatech Hummer 6.6 Sputtering System with rotating, tilted stage and Au/Pd target (2010)
- Ladd Research CO2 Critical Point Dryer (1990)
- Scandium Image analysis software
- Adobe Photoshop software
- Fume hood
- Complete machine shop and machinist available